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  • Microscope probe-sharpening technique improves resolution, durability

    Joseph Lyding, a professor of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique.

    Joseph Lyding, a professor of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique.

    Photo by L. Brian Stauffer

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  • Editor's note: To contact Joe Lyding, call 217-333-8370; email lyding@illinois.edu.
    The paper, “Field-directed Sputter Sharpening for Tailored Probe
                              Materials and Atomic-scale Lithography,” is available online.