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  • Microscope probe-sharpening technique improves resolution, durability

    Joseph Lyding, a professor of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique.

    Joseph Lyding, a professor of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique.

    Photo by L. Brian Stauffer

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      Joseph Lyding, a professor of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique.

      Photo by L. Brian Stauffer

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      A traditionally etched tungsten STM probe, sharpened to a 1-nanometer point after bombarding it with ions.

      Image courtesy Joseph Lyding VIDEO: Joseph Lyding explains the new microscope probe sharpening process.

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